GE Inspection Phasor XS 16:64 Phased Array Flaw Detector
The GE Phasor XS brings the proven advantages of Phased Array technology to a new – and accessible – level. This portable and rugged device combines the value of Phased Array with a codecompliant conventional UT flaw detector. It is simple to use, easy to learn and specially designed with practical, relevant features.
GE Inspection Phasor XS 16:64 Phased Array Flaw Detector
The GE Phasor XS brings the proven advantages of Phased Array technology to a new – and accessible – level. This portable and rugged device combines the value of Phased Array with a codecompliant conventional UT flaw detector. It is simple to use, easy to learn and specially designed with practical, relevant features.
When used in Phased Array mode, the operator can electronically control multiple beams from one probe. The precise beam control including angle, focus and size, results in improved probability of detection (POD) and sizing. With one scan from one contact location, greater area is covered and comprehensive data can be viewed in real time on a full color sector display. When compared to conventional Ultrasonic inspection, the productivity and cost savings from the Phasor XS are easily measured.
Productivity gains
When the inspection requires a different angle with conventional ultrasonic testing, the operator must change his probe and re-visualize the integration of the new information. A different time base and sensitivity level is represented. Although this is not a problem for the skilled operator, it takes time. Through the power of Phasor XS, these inefficiencies are drastically minimized.
Real time color imaging from the Phasor XS supplies an integrated cross-sectional visualization of the part originating from multiple angles. A single A-Scan can also be selected for display in combination with the image. With a single probe, you can achieve more than ever before – and in less time!
GE Inspection Phasor XS 16:64 Phased Array Flaw Detector
Overall, the Phasor XS provides:
- Improved area coverage, faster results
- More information from one scan of the part
- Better recorded result from the generation of an image
- One probe replicates the capabilities of many conventional UT probes and wedges
- Time and cost savings from reduced hours evaluating indications with multiple angles
Measurable time savings!
Some weld inspections require a complete scan with three separate angles. Using the Phasor XS can result in a time savings of two thirds!
Test quality improvements
Defect orientation is a prediction made in the development of a test procedure and an inspection angle is chosen based on this prediction. Beam spread is chosen purposely broad to account for some level of error in the prediction, so essentially it is a compromise.
With the Phasor XS, electronic control of the beam allows test procedures to be developed that will yield higher Probability of Detection (POD), in the same inspection time, by allowing the choice of an ideal beam over the full inspection area. The quality of the scan is improved and the Phasor XS’ full-color, real time sector display with selectable A-Scan supplies the standard accepted method for instant and reliable sizing.
Simple change over
Building Phased Array capabilities into a successful proven operating platform ensures the transition to Phased Array inspection will be cost effective. Phasor XS’ simple menu driven operation of basic Phased Array controls puts the technology within reach of the Level II field inspector. Data is easily interpreted and the cost of training is minimal.
Standard Features
An on board data set memory is combined with removable storage via an SD card for documentation and setup storage. This ensures your operators will be working with consistent setups to get brilliant results that you can see later on the screen or computer
The unique Sector Freeze mode allows review and storage of all the A-Scans behind the image. Select your beam of interest from all of the shots for separate display and improve your sizing with focal and angle control.
- Combined Phased Array and code compliant Conventional UT flaw detector
- Truly portable Phased Array – less than 4 kg (7 lbs)
- Electronically controlled and selectable beam angles, focus and size
- Simultaneous inspection with multiple beams from a single location
- Full color, real time sector display with a selectable ASCAN
- Fullscreen Bscan plus Display reverse and flip
- Rugged packaging to withstand heavy onsite use
- Snap shot image storage of sector images and ASCANS
- Dialog probes 16/64
- Delay law calculator
- Push button control for operation in a bag
- Simple operating scheme
- Image transfer via SD card
GE Inspection Phasor XS 16:64 Phased Array Flaw Detector
Specifications:
Display Size Resolution | 6.5” VGA (640*480 pixel) color TFT, 60Hz refresh rate |
Battery Type | Custom Li-Ion battery pack (3S6P configuration) |
Battery Life | 4 hours minimum |
Battery Charging | External charger that connects directly to the battery pack |
External Power Supply | Universal input (85 – 265V / 50 – 60 Hz) |
Units of Measure | inch and mm |
SD Card Memory | Sealed compartment |
Number of Cycles Focal Laws | Conventional Channel: 1 Phased Array Channels: 128 (max) |
Pulse repetition frequency | Conventional Channel: 15 to 2000Hz Phased Array Channels: 15 to 7680Hz |
Pulser Type | Conventional Channel: Spike Phased Array Channels: Bipolar Squarewave |
Pulser Voltage | Conventional Channel: 300V (max) Phased Array Channels: +/-25V to +/-75V |
Pulser Energy | Conventional Channel: Low, High Phased Array Channels: n/a |
Pulser Rise Time | Conventional Channel: <15ns Phased Array Channels: Not Specified |
Damping | Conventional Channel: 50, 500 and 1000 Phased Array Channels: n/a |
Dual Mode | Conventional Channel: Off and On Phased Array Channels: n/a |
Receiver input Capacitance | Conventional Channel: <50pF Phased Array Channels: |
Maximum input voltage | Conventional Channel: 40Vp-p Phased Array Channels: |
Bandwidth / Amplifier bandpass | Conventional Channel: 0.3 to 15MHz(-3dB points) Phased Array Channels: 0.5 to 10MHz |
Direct Documentation Format | Conventional Channel: JPEG Phased Array Channels: JPEG |
Probe Connections | Conventional Channel: 00 Lemo/ BNC Adaptor Supplied Phased Array Channels: Custom Supplied |
Physical Probe | Conventional Channel: n/a Phased Array Channels: 1 to 64 |
Virtual probe | Conventional Channel: n/a Phased Array Channels: 1 to 16 |
Number of Cycles | Conventional Channel: 1 Phased Array Channels: 1 to 128 |
Pulser Width (1/2 Cycle) | Conventional Channel: n/a Phased Array Channels: 40 to 500ns |
Pulser Delay | Conventional Channel: n/a Phased Array Channels: 0 to 10.24us |
Receiver Delay | Conventional Channel: n/a Phased Array Channels: 0 to 10.24us |
Receiver Input Resistance | Conventional Channel: 1000ohm (dual mode) Phased Array Channels: 220ohm |
Analog Gain | Conventional Channel: 0 to 110.0dB Phased Array Channels: 0 to 40.0dB |
Digital Gain | Conventional Channel: n/a Phased Array Channels: 0 to 50.0dB |
Frequency Select | Conventional Channel: 2.25MHz, 5MHz, LP and HP Phased Array Channels: 2.25MHz, 5MHz, LP and HP |
Rectification | Conventional Channel: PosHW, NegHW and Fullwave Phased Array Channels: PosHW, NegHW and Fullwave |
Measurement Resolution | Conventional Channel: 5nsec Phased Array Channels: 5nsec |
Displayed Readings | Conventional Channel: A%A, A%B, SA/, SA^, SB/, SB^ Phased Array Channels: A%A, A%B, SA/, SA^, SB/, SB^ |
VGA output | Conventional Channel: Yes Phased Array Channels: Yes |
SD Card Memory | Conventional Channel: Yes Phased Array Channels: Yes |
RS 232 interface | Conventional Channel: Yes Phased Array Channels: Yes |
Auto Timebase Calibration | Conventional Channel: Yes Phased Array Channels: No |
Reject | Conventional Channel: 0 to 80% Phased Array Channels: 0 to 80% |
TCG | Conventional Channel: 16 points (max) – 6dB/usec Phased Array Channels: 16 points (max) – 6dB/usec |
Sound Velocity | Conventional Channel: .0393 – .5905”/us[1000 – 15000m/s] Phased Array Channels: .0393 – .5905”/us[1000 – 15000m/s] |
Range | Conventional Channel: 5m @ steel shear velocity Phased Array Channels: 1m @ steel shear velocity |
Weight | Conventional Channel: 7.5lbs (with batteries) Phased Array Channels: 7.5lbs (with batteries) |
Size | Conventional Channel: 11.1”W x 6.75”H x 6.25”D (282 x 171 x 159mm) Phased Array Channels: 11.1”W x 6.75”H x 6.25”D (282 x 171 x 159mm) |
Display Delay | Conventional Channel: 2.5m @ steel shear velocity Phased Array Channels: 1m @ steel shear velocity |
Gates | Conventional Channel: A, B Phased Array Channels: A,B,IF |
Gate Threshold | Conventional Channel: 5% to 95% Phased Array Channels: 5% to 95% |
Gate Start | Conventional Channel: [0.1mm to 2m] Phased Array Channels: 0.1mm to 1m |
Gate Width | Conventional Channel: [0.1mm to 2m] Phased Array Channels: 0.1mm to 1m |
Gate Modes | Conventional Channel: Off, Pos, Neg[Off, Coincidence, Anticoincidence] Phased Array Channels: |
TOF Modes | Conventional Channel: Flank, Peak Phased Array Channels: Flank, Peak |
Scan type | Conventional Channel: n/a Phased Array Channels: Linear or Sector |
Data visualization refresh rate | Conventional Channel: 60Hz Phased Array Channels: 60Hz |
Available views | Conventional Channel: Ascan Phased Array Channels: Ascan only, Image only, Ascan + Image |
Dialog Languages | Conventional Channel: English, Spanish, German, French, Chinese, Japanese Phased Array Channels: English, Spanish, German, French, Chinese, Japanese |
Environmental tests | |
Cold Storage | -20C for 72 hrs, 502.4 Procedure I |
Cold Operation | 0C for 16 hrs, 502.4 Procedure II |
Heat Storage | +70C for 48 hrs, 501.4 Procedure I |
Heat Operation | +55C for 16 hrs, 501.4 Procedure II |
Damp Heat / Humidity | 10 Cycles: 10hrs at +65C down to +30C, 10 hrs at +30C up to +65C, Transition within 2 hrs, 507.4 |
Temperature Shock | 3 Cycles: 4 hrs at –20C up to +70C, 4 hrs at +70C, Transitions within 5 minutes, 503.4 Procedure II |
Vibration | 514.5-5 Procedure I, Annex C, Figure 6, General exposure: 1hr each axis |
Shock | 6 cycles each axis, 15g, 11ms half sine, 516.5 Procedure I |
Loose Cargo | 514.5 Procedure II |
Transit Drop | 516.5 Procedure IV, 26 drops |
IP54 / IEC529 Dust Proof / Dripping water proof as per IEC 529 | |
Environmental sealing tests | IP54 / IEC529 … Dust Proof / dripping water proof as per IEC 529 specifications for IP54 classification Enviromental op temp Low battery indication Amplitude variation expected over battery life Graticule Architectural suppression Linearity on timebase Pulser, Voltage p to p, rise time, duration, fall time, Reverberation ampitude, frequncy spectrum plot Amplifier and attenuator |
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